Surface Topography Challenge 2023 - Espinosa Group - Sample P46
Sample P46 (Rougher) - CrN deposited on unpolished side of silicon wafer followed by isotropic reactive ion etching. Topography data collected using profilometry, scanning electron microscopy, and atomic force microscopy in tapping (AC) mode, quantitative imaging (i.e. fast force mapping) mode, and contact mode.