CrN Q93
type: Dataset
version: 1
date published: 2025-04-28T16:09:40.764735+00:00
language: en
keywords: surface
keywords: topography
creator: Cyrian Leriche
creator: Bart Weber
publisher: contact.engineering
provider: contact.engineering
included in data catalog: contact.engineering
license: https://creativecommons.org/licenses/by/4.0/legalcode
is accessible for free: true
conditions of access: open access
distribution: DataDownload
  encoding format: application/zip
description: CrN rough Q93 flat sample imaged by AFM (Dimension ICON from Bruker), in tapping mode using RTESPA-300 probes. Cleaning procedure: 30 min ultrasonic bath immersed subsequently in acetone, isopropanol, ethanol and deionized water. 3 measurements describe the surface; a 1x1 um (512x512 pixels, hRMS = 4.1 nm, bad measurement), a 10x10um (1024x1024 pixels, hRMS = 100 nm) and a 90x90 um (4096x4096 pixels, hRMS = 650 nm). All measurements are made with the same probe. The other scanning parameter are set to optimize as best as possible the quality of the measurement (scanning rate, integral gain, proportional gain and amplitude setup). The data have been proceeded through Gwyddion; the data were normalized by a mean plane subtraction, the rows were aligned using a polynomial method. The data were extracted as height matrices in the form of txt files. The parameter used to characterize the surface here is the root mean square of heights (hRMS or sq), calculated with Gwyddion.

Cyrian Leriche
type: Person
given name: Cyrian
family name: Leriche
affiliation: University of Pennsylvania

Bart Weber
type: Person
given name: Bart
family name: Weber
affiliation: Advanced Research Center for Nanolithography