Measurements Bandwidths Description Permissions Authors License How to cite
A digital surface twin is a container for multiple measurements of the same specimen or material. This digital surface twin contains 4 individual measurements. The gallery below cycles through visualizations of those measurements. Move mouse next to a picture to stop the animation. Click on a picture to open the corresponding measurement.
This bandwidth plot shows the range of length scales that have been measured for this digital surface twin. Each of the blocks below represents one measurement. Part of the bandwidth shown may be unreliable due to the configured instrument's measurement capacities.
Move on a bar to see the name and a thumbnail and click to open the corresponding measurement.
Microcrystalline diamond film deposited on silicon wafer Substrate Manufacturer : Advanced Diamond Technologies, Inc.
This table lists users that can view, change, delete or share this digital surface twin. Click here for information which surfaces are shared with you or by you.
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Author Name Orcid ID Affiliations
Information about the license under which this surface has been published
License Name Creative Commons Attribution 4.0 International Public License
Description https://creativecommons.org/licenses/by/4.0/
Legal Code https://creativecommons.org/licenses/by/4.0/legalcode

How to cite this surface?

Here are suggestions for some citation formats. Please click on a format name in order to expand. If you need another format, please open an issue on GitHub.

Text format with link
Luke A. Thimons, Abhijeet Gujrati, Antoine Sanner, Lars Pastewka, Tevis D. B. Jacobs. (2021). contact.engineering. Microcrystalline Diamond (Version 1). https://doi.org/10.57703/ce-btpax 
TY  - ELEC
TI  - Microcrystalline Diamond (Version 1)
AU  - Luke A. Thimons
AU  - Abhijeet Gujrati
AU  - Antoine Sanner
AU  - Lars Pastewka
AU  - Tevis D. B. Jacobs
PY  - 2021/05/21/
UR  - https://doi.org/10.57703/ce-btpax
DB  - contact.engineering
N1  - Microcrystalline diamond film deposited on silicon wafer
Substrate Manufacturer : Advanced Diamond Technologies, Inc.
KW  - surface
KW  - topography
ER  -
@misc{
            microcrystalline_diamond_v1,
            title  = {Microcrystalline Diamond (Version 1)},
            author = {Luke A. Thimons and Abhijeet Gujrati and Antoine Sanner and Lars Pastewka and Tevis D. B. Jacobs},
            year   = {2021},
            note   = {Microcrystalline diamond film deposited on silicon wafer
Substrate Manufacturer : Advanced Diamond Technologies, Inc.},
            keywords = {surface,topography},
            howpublished = {https://doi.org/10.57703/ce-btpax},
        }
@online{
            microcrystalline_diamond_v1,
            title  = {Microcrystalline Diamond},
            version = {1},
            author = {Luke A. Thimons and Abhijeet Gujrati and Antoine Sanner and Lars Pastewka and Tevis D. B. Jacobs},
            year   = {2021},
            month  = {5},
            date   = {2021-05-21},
            note   = {Microcrystalline diamond film deposited on silicon wafer
Substrate Manufacturer : Advanced Diamond Technologies, Inc.},
            keywords = {surface,topography},
            url = {https://doi.org/10.57703/ce-btpax},
            urldate = {2023-03-27}
        }
Experimental data published by Luke Thimons
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