TY  - ELEC
TI  - Microcrystalline Diamond (Version 1)
AU  - Abhijeet Gujrati
AU  - Subarna R. Khanal
AU  - Lars Pastewka
AU  - Tevis D. B. Jacobs
PY  - 2020/12/11/
UR  - https://doi.org/10.57703/ce-mz7z5
DB  - contact.engineering
N1  - MCD surface topography measured using TEM, AFM, and Stylus Profilometry
KW  - surface
KW  - topography
ER  -

@misc{
            microcrystalline_diamond_v1,
            title  = {Microcrystalline Diamond (Version 1)},
            author = {Abhijeet Gujrati and Subarna R. Khanal and Lars Pastewka and Tevis D. B. Jacobs},
            year   = {2020},
            note   = {MCD surface topography measured using TEM, AFM, and Stylus Profilometry},
            keywords = {surface,topography},
            howpublished = {https://doi.org/10.57703/ce-mz7z5},
        }

@online{
            microcrystalline_diamond_v1,
            title  = {Microcrystalline Diamond},
            version = {1},
            author = {Abhijeet Gujrati and Subarna R. Khanal and Lars Pastewka and Tevis D. B. Jacobs},
            year   = {2020},
            month  = {12},
            date   = {2020-12-11},
            note   = {MCD surface topography measured using TEM, AFM, and Stylus Profilometry},
            keywords = {surface,topography},
            url = {https://doi.org/10.57703/ce-mz7z5},
            urldate = {2025-04-06}
        }